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VLSI Test Principles and Architectures
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VLSI Test Principles and Architectures

inbunden, 2006
Engelska
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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
Undertitel
Design for Testability
ISBN
9780123705976
Språk
Engelska
Vikt
1770 gram
Utgivningsdatum
2006-08-14
Sidor
808