Gå direkte til innholdet
Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
Spar

Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies

This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm.

Opplag
2020 ed.
ISBN
9783030415358
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
21.3.2020
Antall sider
237