Spar
X-Ray Microscopy II
This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987.
- Undertittel
- Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987
- Redaktør
- David Sayre, Malcolm Howells, Janos Kirz, Harvey Rarback
- Opplag
- Softcover reprint of the original 1st ed. 1988
- ISBN
- 9783662144909
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 3.10.2013
- Antall sider
- 455
