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X-Ray Diffraction by Disordered Lamellar Structures
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X-Ray Diffraction by Disordered Lamellar Structures

1 184,-
New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians.
Undertittel
Theory and Applications to Microdivided Silicates and Carbons
Oversetter
R. Setton
Opplag
Softcover reprint of the original 1st ed. 1990
ISBN
9783642748042
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
13.12.2011
Antall sider
371