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VLSI Design and Test for Systems Dependability
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VLSI Design and Test for Systems Dependability

Engelsk

This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.

The book consists of three parts.

Redaktør
Shojiro Asai
Opplag
Softcover reprint of the original 1st ed. 2019
ISBN
9784431568636
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
26.1.2019
Antall sider
800