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VLSI Design and Test for Systems Dependability
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VLSI Design and Test for Systems Dependability

innbundet, 2018
Engelsk

This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.

The book consists of three parts.

Redaktør
Shojiro Asai
Opplag
1st ed. 2019
ISBN
9784431565925
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
1.8.2018
Antall sider
800