Spar
VLSI Design and Test
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
- Undertittel
- 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
- Opplag
- 2013 ed.
- ISBN
- 9783642420238
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 10.12.2013
- Antall sider
- 388
