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Thin Film and Depth Profile Analysis
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Thin Film and Depth Profile Analysis

Oechsner . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Requirements for Thin Film and In-Depth Analysis . 2 Object and Outl i ne of the Book . Werner (With 25 Fi gures) . 1 Depth Profi 1 ing . 3 Determining Physical Structures in Material Research . 1 X-Ray Diffraction . 2 X-Ray Double Crystal Diffraction .
Redaktør
H. Oechsner
Opplag
Softcover reprint of the original 1st ed. 1984
ISBN
9783642465017
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
27.3.2012
Antall sider
208