Spar
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Forfatter:
heftet, 2023
Engelsk
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management.
- Forfatter
- Xiong Du, Jun Zhang, Gaoxian Li, Yaoyi Yu, Cheng Qian, Rui Du
- Opplag
- 2022 ed.
- ISBN
- 9789811931345
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 9.7.2023
- Antall sider
- 172
