Spar
Testability Concepts for Digital ICs
Forfatter:
heftet, 2012
Engelsk
Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on.
- Undertittel
- The Macro Test Approach
- Forfatter
- F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen
- Opplag
- Softcover reprint of the original 1st ed. 1995
- ISBN
- 9781461360049
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 4.10.2012
- Antall sider
- 212
