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Test Generation of Crosstalk Delay Faults in VLSI Circuits
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Test Generation of Crosstalk Delay Faults in VLSI Circuits

innbundet, 2018
Engelsk
The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.
Opplag
2019 ed.
ISBN
9789811324925
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
10.10.2018
Antall sider
156