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Surface and Interface Characterization by Electron Optical Methods
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Surface and Interface Characterization by Electron Optical Methods

The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident.
Redaktør
Ugo Valdre
Opplag
Softcover reprint of the original 1st ed. 1988
ISBN
9781461595397
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
25.11.2012
Antall sider
319