
Spectroscopic Ellipsometry for Photovoltaics
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.
The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
- Undertittel
- Volume 1: Fundamental Principles and Solar Cell Characterization
- Redaktør
- Hiroyuki Fujiwara, Robert W. Collins
- Opplag
- 2018 ed.
- ISBN
- 9783319753751
- Språk
- Engelsk
- Vekt
- 446 gram
- Utgivelsesdato
- 24.1.2019
- Antall sider
- 594
