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Semiconductor Device Reliability
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Semiconductor Device Reliability

This publication is a compilation of papers presented at the Semiconductor Device Reliabi­ lity Workshop sponsored by the NATO International Scientific Exchange Program. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions.
Opplag
Softcover reprint of the original 1st ed. 1990
ISBN
9789401076203
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
5.10.2011
Forlag
Springer
Antall sider
575