Spar
Secondary Ion Mass Spectrometry SIMS III
Today it is extensively and successfully applied in such different fields as depth profiling and imaging of semiconductor devices, in isotope analysis of minerals, in imaging biological tissues, in the study of catalysts and catalytic reactions, in oxide-layer analysis on metals in drug detection, and in the analysis of body fluids.
- Undertittel
- Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30–September 5, 1981
- Redaktør
- A. Benninghoven, J. Giber, J. Laszlo, M. Riedel, H.W. Werner
- Opplag
- Softcover reprint of the original 1st ed. 1982
- ISBN
- 9783642881541
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 26.7.2012
- Antall sider
- 447
