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Scanning Microscopy for Nanotechnology
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Scanning Microscopy for Nanotechnology

innbundet, 2006
Engelsk

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation.

Undertittel
Techniques and Applications
Opplag
2007 ed.
ISBN
9780387333250
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
27.11.2006
Antall sider
522