
Scanning Microscopy for Nanotechnology
Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation.
- Undertittel
- Techniques and Applications
- Redaktør
- Weilie Zhou, Zhong Lin Wang
- Opplag
- 2007 ed.
- ISBN
- 9780387333250
- Språk
- Engelsk
- Vekt
- 446 gram
- Utgivelsesdato
- 27.11.2006
- Antall sider
- 522
