
Scanning Ion Conductance Microscopy
This book provides a selection of recent developments in scanning ion conductance microscopy (SICM) technology and applications.
- Redaktør
- Tilman E. Schäffer
- Opplag
- 1st ed. 2022
- ISBN
- 9783031144455
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 2.10.2023
- Antall sider
- 230
