Spar
Scanning Electron Microscopy and X-Ray Microanalysis
heftet, 2013
Engelsk
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.
- Undertittel
- Third Edition
- Forfatter
- Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
- Opplag
- Third Edition 2003
- ISBN
- 9781461349693
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 31.5.2013
- Antall sider
- 689
