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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
ISBN
9789400776623
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
29.10.2013
Forlag
Springer
Antall sider
187