Spar
Progress in Nanoscale Characterization and Manipulation
It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy.
- Redaktør
- Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai
- Opplag
- Softcover Reprint of the Original 1st 2018 ed.
- ISBN
- 9789811344206
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 11.1.2019
- Antall sider
- 508
