Spar
Principles of Analytical Electron Microscopy
heftet, 2013
Engelsk
All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.
- Redaktør
- Joseph Goldstein, David C. Joy, Alton D. Romig Jr.
- Opplag
- Softcover reprint of the original 1st ed. 1986
- ISBN
- 9781489920393
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 8.7.2013
- Antall sider
- 448
