
Physical Principles of Electron Microscopy
Scanning and stationary-beam electron microscopes have become an indespensible tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.
- Undertittel
- An Introduction to TEM, SEM, and AEM
- Forfatter
- R.F. Egerton
- Opplag
- 1st ed. 2005. Corr. 2nd printing 2011
- ISBN
- 9780387258003
- Språk
- Engelsk
- Vekt
- 446 gram
- Utgivelsesdato
- 3.8.2005
- Antall sider
- 202
