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Physical Principles of Electron Microscopy
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Physical Principles of Electron Microscopy

Forfatter:
innbundet, 2005
Engelsk

Scanning and stationary-beam electron microscopes have become an indespensible tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.

Undertittel
An Introduction to TEM, SEM, and AEM
Forfatter
R.F. Egerton
Opplag
1st ed. 2005. Corr. 2nd printing 2011
ISBN
9780387258003
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
3.8.2005
Antall sider
202