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Optical Characterization of Epitaxial Semiconductor Layers
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Optical Characterization of Epitaxial Semiconductor Layers

Engelsk
The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decade.
Opplag
Softcover reprint of the original 1st ed. 1996
ISBN
9783642796807
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
14.12.2011
Antall sider
429