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Nanotechnology: Principles and Practices
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Nanotechnology: Principles and Practices

The book also explains the functional principles of essential techniques, such as scanning tunneling microscopy (STM), atomic force microscopy (AFM), scanning near field optical microscopy (SNOM), Raman spectroscopy and photoelectron microscopy.
Opplag
Softcover reprint of the original 3rd ed. 2015
ISBN
9783319791630
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
27.3.2019
Antall sider
403