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Nanometer Variation-Tolerant SRAM
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Nanometer Variation-Tolerant SRAM

This essential reference combines state-of-the-art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. It shows designers how to apply practical techniques that optimize memory yield.
Undertittel
Circuits and Statistical Design for Yield
Opplag
2013 ed.
ISBN
9781493902200
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
15.10.2014
Antall sider
172