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Nanometer Technology Designs
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Nanometer Technology Designs

Forfatter:
Engelsk
Supply noise (including IR-drop, ground bounce, and Ldi/dt) effects on chip performance, high test pattern volume, low fault/defect coverage, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges.
Undertittel
High-Quality Delay Tests
Forfatter
Nisar Ahmed
Opplag
2008
ISBN
9781441945594
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
14.12.2011
Antall sider
281