
Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals
This thesis introduces a unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials, providing high-resolution computer-generated imagery (CGI) and diagrams to aid readers’ understanding and visualization.
- Undertittel
- A Scanning Probe Microscopy Approach
- Forfatter
- Nicholas D. Kay
- Opplag
- Softcover reprint of the original 1st ed. 2018
- ISBN
- 9783319888989
- Språk
- Engelsk
- Vekt
- 310 gram
- Serie
- Springer Theses
- Utgivelsesdato
- 4.9.2018
- Antall sider
- 122
