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Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals
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Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals

This thesis introduces a unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials, providing high-resolution computer-generated imagery (CGI) and diagrams to aid readers’ understanding and visualization.

Undertittel
A Scanning Probe Microscopy Approach
Opplag
Softcover reprint of the original 1st ed. 2018
ISBN
9783319888989
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
4.9.2018
Antall sider
122