
Modeling Nanoscale Imaging in Electron Microscopy
Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy.
- Redaktør
- Thomas Vogt, Wolfgang Dahmen, Peter Binev
- Opplag
- 2012 ed.
- ISBN
- 9781461421900
- Språk
- Engelsk
- Vekt
- 446 gram
- Utgivelsesdato
- 2.3.2012
- Antall sider
- 182
