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Metal Impurities in Silicon- and Germanium-Based Technologies
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Metal Impurities in Silicon- and Germanium-Based Technologies

material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.
Undertittel
Origin, Characterization, Control, and Device Impact
Opplag
1st ed. 2018
ISBN
9783319939247
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
22.8.2018
Antall sider
438