
Machine Learning Support for Fault Diagnosis of System-on-Chip
This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems.
- Redaktør
- Patrick Girard, Shawn Blanton, Li-C. Wang
- Opplag
- 2023 ed.
- ISBN
- 9783031196386
- Språk
- Engelsk
- Vekt
- 446 gram
- Utgivelsesdato
- 14.3.2023
- Antall sider
- 316
