Spar
Lifetime Spectroscopy
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques.
- Undertittel
- A Method of Defect Characterization in Silicon for Photovoltaic Applications
- Forfatter
- Stefan Rein
- Opplag
- 2005 ed.
- ISBN
- 9783540253037
- Språk
- Engelsk
- Vekt
- 446 gram
- Utgivelsesdato
- 23.6.2005
- Antall sider
- 492
