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Investigation of Gate Current In Neutron Irradiated AlxGa1-xN/GaN Heterogeneous Field Effect Transistors Using Voltage and Temperature Dependence
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Investigation of Gate Current In Neutron Irradiated AlxGa1-xN/GaN Heterogeneous Field Effect Transistors Using Voltage and Temperature Dependence

Forfatter:
pocket, 2012
Engelsk
Forfatter
Thomas E Gray
ISBN
9781288308347
Språk
Engelsk
Vekt
186 gram
Utgivelsesdato
16.11.2012
Antall sider
126