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Interfacial Compatibility in Microelectronics
This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.
- Undertittel
- Moving Away from the Trial and Error Approach
- Forfatter
- Tomi Laurila, Vesa Vuorinen, Mervi Paulasto-Kröckel, Markus Turunen, Toni T. Mattila, Jorma Kivilahti
- Opplag
- 2012 ed.
- ISBN
- 9781447160687
- Språk
- Engelsk
- Vekt
- 310 gram
- Serie
- Microsystems
- Utgivelsesdato
- 22.2.2014
- Forlag
- Springer London Ltd
- Antall sider
- 218
