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Infrared Ellipsometry on Semiconductor Layer Structures
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Infrared Ellipsometry on Semiconductor Layer Structures

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy.

Undertittel
Phonons, Plasmons, and Polaritons
Opplag
2004 ed.
ISBN
9783540232490
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
26.11.2004
Antall sider
196