Infrared Ellipsometry on Semiconductor Layer Structures
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy.
- Undertittel
- Phonons, Plasmons, and Polaritons
- Forfatter
- Mathias Schubert
- Opplag
- 2004 ed.
- ISBN
- 9783540232490
- Språk
- Engelsk
- Vekt
- 446 gram
- Utgivelsesdato
- 26.11.2004
- Antall sider
- 196
