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High Quality Test Pattern Generation and Boolean Satisfiability
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High Quality Test Pattern Generation and Boolean Satisfiability

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.
Opplag
2012 ed.
ISBN
9781489988478
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
20.10.2014
Antall sider
193