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High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
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High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip

This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors.
Opplag
1st ed. 2018
ISBN
9789811010729
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
5.7.2017
Antall sider
197