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Helium Ion Microscopy
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Helium Ion Microscopy

innbundet, 2016
Engelsk
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field.
Opplag
1st ed. 2016
ISBN
9783319419886
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
12.10.2016
Antall sider
526