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Helium Ion Microscopy
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Helium Ion Microscopy

Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century.

Undertittel
Principles and Applications
Forfatter
David C. Joy
Opplag
2013 ed.
ISBN
9781461486596
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
14.9.2013
Antall sider
64