
Helium Ion Microscopy
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century.
- Undertittel
- Principles and Applications
- Forfatter
- David C. Joy
- Opplag
- 2013 ed.
- ISBN
- 9781461486596
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 14.9.2013
- Antall sider
- 64
