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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Forfatter:
Engelsk
The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Opplag
Softcover reprint of hardcover 1st ed. 2009
ISBN
9781441946744
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
23.11.2010
Antall sider
332