Gå direkte til innholdet
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
Spar

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Forfatter:
innbundet, 2009
Engelsk
The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Opplag
2009 ed.
ISBN
9780387857305
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
19.3.2009
Antall sider
332