
Fundamentals of Nanoscale Film Analysis
The book describes the fundamentals of materials characterization from the standpoint of the incident photons or particles which interrogate nanoscale structures.
- Forfatter
- Terry L. Alford, L.C. Feldman, James W. Mayer
- Opplag
- 2007 ed.
- ISBN
- 9780387292601
- Språk
- Engelsk
- Vekt
- 446 gram
- Utgivelsesdato
- 16.2.2007
- Antall sider
- 336
