
Fundamentals of Electromigration-Aware Integrated Circuit Design
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
- Forfatter
- Jens Lienig, Susann Rothe, Matthias Thiele
- Opplag
- Second Edition 2025
- ISBN
- 9783031800221
- Språk
- Engelsk
- Vekt
- 446 gram
- Utgivelsesdato
- 26.2.2025
- Antall sider
- 167
