
Fundamentals of Electromigration-Aware Integrated Circuit Design
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
- Forfatter
- Jens Lienig, Matthias Thiele
- Opplag
- Softcover Reprint of the Original 1st 2018 ed.
- ISBN
- 9783030088118
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 14.12.2018
- Antall sider
- 159
