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From scientific instrument to industrial machine
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From scientific instrument to industrial machine

Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In this book, the authors look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company.
Undertittel
Coping with architectural stress in embedded systems
Opplag
2012 ed.
ISBN
9789400741461
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
29.4.2012
Forlag
Springer
Antall sider
112