
Field Emission Scanning Electron Microscopy
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution.
- Undertittel
- New Perspectives for Materials Characterization
- Forfatter
- Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
- Opplag
- 1st ed. 2018
- ISBN
- 9789811044328
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 6.10.2017
- Antall sider
- 137
