Spar
Failure Analysis of Integrated Circuits
innbundet, 1999
Engelsk
Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
- Undertittel
- Tools and Techniques
- Redaktør
- Lawrence C. Wagner
- Opplag
- 1999 ed.
- ISBN
- 9780412145612
- Språk
- Engelsk
- Vekt
- 446 gram
- Utgivelsesdato
- 31.1.1999
- Forlag
- Chapman and Hall
- Antall sider
- 255
