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Evaluation of Advanced Semiconductor Materials by Electron Microscopy
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Evaluation of Advanced Semiconductor Materials by Electron Microscopy

With these developments in mind, an application was made to the NATO Science Committee in late summer 1987 to fund an Advanced Research Work­ shop to review the electron microscopy of advanced semiconductors.
Redaktør
David Cherns
Opplag
Softcover reprint of the original 1st ed. 1989
ISBN
9781461278504
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
13.10.2011
Antall sider
412