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Electromigration Modeling at Circuit Layout Level
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Electromigration Modeling at Circuit Layout Level

Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels.
Opplag
2013 ed.
ISBN
9789814451208
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
4.5.2013
Antall sider
103