Spar
Electromigration and Electronic Device Degradation
innbundet, 1994
Engelsk
Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
- Redaktør
- Aris Christou
- ISBN
- 9780471584896
- Språk
- Engelsk
- Vekt
- 680 gram
- Utgivelsesdato
- 7.2.1994
- Forlag
- John Wiley Sons Inc
- Antall sider
- 360
