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Digital Integrated Circuit Testing from a Quality Perspective
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Digital Integrated Circuit Testing from a Quality Perspective

innbundet, 1993
Engelsk
Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a
Opplag
1993 ed.
ISBN
9780442006433
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
31.8.1993
Antall sider
180